Onto Innovation
ONTOAmerican process-control company for semiconductor manufacturing; its TrueADC software combines deep learning with a defect library to classify wafer defects.
Product
Selected offerings — the AI products recorded here, not the vendor's full catalogue.
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TrueADC Application
Defect-classification software that combines deep learning, a dynamic library of real defect examples and a multi-engine mode to classify wafer defects inline, flagging low-confidence defects as unknown and cutting manual review by over 70%.
Closest alternatives 1
Similar products 18
Closest alternatives are pairs a vendor page itself compares. Similar products are matched from what each product does; nothing in that group is asserted as a rivalry.
Sources
- Total funding
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Listed company; no funding rounds.
- Market cap
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No market-capitalisation figure read from a primary source.
- Founded
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Regulatory filing · 11 Oct 2026
SEC EDGAR filer record for CIK 0000704532: Onto Innovation Inc., formerly Nanometrics Inc., name change dated 2019-10-25 (the Nanometrics-Rudolph merger). The legal entity is older; 2019 is when Onto Innovation was formed, as the item research recorded.
- Public listing
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Regulatory filing · 11 Oct 2026
SEC registrant ONTO INNOVATION INC., CIK 0000704532, files 10-Ks; NYSE: ONTO.
- Description
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Company disclosure · 11 Oct 2026
TrueADC page: "combining deep learning, real-world defect modeling, and intuitive workflows".
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