LiB.Overhang Analysis

Application

AI-powered software for Nikon's XT H-series X-ray CT systems that measures anode overhang in lithium-ion battery cells in 3D, faster and more precisely than manual slice inspection.

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TypeApplication
RoleStandalone tool
AvailabilitySold
DeploymentOn-device
Intended forEnterprise
SecurityNot recorded
StatusActive
Sold withinPackaging not stated — the vendor’s page was checked and named no parent or plan
PricingNot recorded

What it does

Features 3

industry.nikon.com

Sources

Pricing

Not found · 10 Oct 2026

No published price (standard s4.1 row 3).

Description

Official documentation · 10 Oct 2026

"Using cutting-edge AI, anode overhang can now be measured in 3D faster and more precisely." Launch news (2023-01-12, https://industry.nikon.com/en-gb/news/overhang-analysis-using-x-ray-ct/): "software powered by artificial intelligence" for XT H-series CT.

Sold within

Not found · 10 Oct 2026

Contact form only; the page does not state whether it is sold alone or with a CT system (standard s4).

Name

Official documentation · 10 Oct 2026

"LiB.Overhang Analysis".

URL

Official documentation · 10 Oct 2026

Nikon Metrology's own product page under Products > X-ray and CT.

Deployment

Official documentation · 10 Oct 2026

Runs with Nikon's CT systems at the customer's site.

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