Hitachi High-Tech
Japanese scientific-instruments and semiconductor-equipment maker; its CR7300 defect-review SEM adopts AI based automatic defect classification (ADC).
Product
Selected offerings — the AI products recorded here, not the vendor's full catalogue.
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Defect Review SEM CR7300 Series Hardware
Inline defect-review scanning electron microscope for chip fabs, with high-speed automatic defect review and AI based automatic defect classification (ADC).
Closest alternatives 1
Similar products 20
Closest alternatives are pairs a vendor page itself compares. Similar products are matched from what each product does; nothing in that group is asserted as a rivalry.
Sources
- Total funding
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No funding stated; not a venture-funded company.
- Valuation
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No valuation published.
- Founded
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Company disclosure · 11 Oct 2026
Company Outline: "Established April 12, 1947".
- Public listing
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Company disclosure · 11 Oct 2026
Company Outline gives capital (7,938 million yen) and revenue (821.7 billion yen, FY ended March 2026) and no stock-exchange listing.
- Description
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Company disclosure · 11 Oct 2026
CR7300 page: "Improved defect classification performance and accuracy remarkably by adopting AI based ADC(Automatic Defect Classification)".
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