OPTELICS AI²

Name: OPTELICS AI²
Brand: Lasertec

Hardware

Automatic inspection and review system for semiconductor wafers that combines defect inspection, high-magnification review and 3D surface profiling in one device, with deep learning-based image classification.

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TypeHardware

RoleStandalone tool

Bought forAsk questions of my own data, Train or fine-tune a model

AvailabilitySold

DeploymentOn-device

Intended forEnterprise

SecurityNot recorded

StatusActive

Sold withinPackaging not stated — the vendor’s page was checked and named no parent or plan

PricingNot recorded

Pricing, Deployment, Sold within — lasertec.co.jp · 11 Oct 2026

What it does

Semiconductor manufacturing equipment
Industrial automation
Data analysis
Visual inspection

Features 4

High-speed inspectionInspects a whole 3-inch wafer in 15 minutes with sub-micron sensitivity.
High-magnification reviewHigh-magnification surface shape profiling available by switching the objective lens.
Deep learning-based classificationDeep learning-based high-precision image classification, patterned sample inspection and specific defect inspection.
Transparent sample inspectionInspection, review and profiling of transparent samples without interference of backside reflection.

lasertec.co.jp

How it compares

Voyager 1035
Named as a competitor in KLA's own 10-K; both are AI-enabled semiconductor-manufacturing-equipment vendors.

including companies such as Applied Materials, Inc., ASML Holding N.V., Hitachi High-Tech Corporation, Lasertec, Inc. and Onto Innovation, Inc.
Regulatory filing · 11 Oct 2026

Sources

Pricing

Not found · 11 Oct 2026

Capital equipment or software sold through the vendor's sales channel; no price on the product page.

Description

Official documentation · 11 Oct 2026

OPTELICS AI² page: "Deep learning-based high-precision image classification, patterned sample inspection, and inspection of specific types of defects".

What it does

Official documentation · 11 Oct 2026

OPTELICS AI² page: "Deep learning-based high-precision image classification, patterned sample inspection, and inspection of specific types of defects".

Sold within