Voyager 1035

Hardware

Laser-scanning patterned-wafer inspection system for advanced logic and memory fabs, built around DefectWise, a deep-learning algorithm that separates defects of interest from pattern noise and nuisance defects inline to speed up process-excursion diagnosis.

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TypeHardware
RoleStandalone tool
AvailabilitySold
DeploymentOn-device
Intended forEnterprise
SecurityNot recorded
StatusActive
Sold withinPackaging not stated — the vendor’s page was checked and named no parent or planNot found · 22 Sep 2026
PricingNot recordedNot found · 22 Sep 2026
Sources—

No list price published; capital wafer-inspection equipment is sold by quote through KLA's sales organization.

What it does

kla.com

Sources

Pricing

Not found · 22 Sep 2026

No pricing surface found; capital fab equipment of this kind is quote-sold, the same shape as Applied Materials' SEMVision H20.

Description

Official documentation · 20 Sep 2026

Same sourcing note as url above; description also draws on the ASM International and Semiconductor Digest coverage of the Voyager 1035 launch (both naming DefectWise).

Sold within

Not found · 22 Sep 2026

Own dedicated product page with a named system and named AI algorithm, but no self-serve or standalone-rate evidence -- quote-sold capital equipment.

Name

Official documentation · 20 Sep 2026

Same sourcing note as url above.

URL

Official documentation · 20 Sep 2026

URL and DefectWise/Voyager naming confirmed by a real-browser fetch, 2026-09-20 (docs/audits/company-admission-standard.md §1). A later WebFetch attempt against kla.com (both this URL and kla.com/advance/innovation/voyager-1035-a-unique-combination-of-deep-learning-speed-and-sensitivity) was refused by KLA's own bot-block, the same failure the earlier fetch hit on a plain fetch -- not independently re-verified live, relying on that real-browser read plus corroborating indexed content from the kla.com/advance/innovation URL surfaced via web search ("The landmark attribute of Voyager 1035 is DefectWise deep learning technology that provides fast, inline separation of defects of interest from pattern noise and nuisance defects").

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