ASML vs Nikon
Relationship
ASML's 20-F names Nikon one of its two main competitors in DUV lithography.
1 shared capability — Across all their products, both list visual inspection.
Ludbee capability tags · every product each company sellsDifferent layer — Nikon ships application, not the same layer.
Ludbee product recordsNamed in filing — “We compete primarily with Canon and Nikon in respect of DUV systems.”
sec.gov · checked 2026-10-17Aligned comparison
Capability overlap
Shared · 1
Not verified for Nikon · 1
Recorded for ASML. Nikon’s product records say nothing either way — a missing record is not a missing capability.
Not verified for ASML · 3
Recorded for Nikon. ASML’s product records say nothing either way — a missing record is not a missing capability.
Products, side by side
Hand-checked pairing
ASML
No shared stack layer with the other side.
Nikon
No shared stack layer with the other side.
No counterpart
ASML sells these in a stack layer with no product recorded for Nikon yet — nothing on the other side to compare them against.
Hardware
Deep-ultraviolet scanners, dry and immersion, that pattern the majority of layers on a chip.
Extreme-ultraviolet lithography machines used to print the leading-edge nodes most AI accelerators are made on.
Measures and inspects wafers between process steps so defects are caught before they reach a finished die.
ASML reconditions and resells older PAS 5500 and TWINSCAN XT/NXT DUV lithography systems with a new warranty and extended-lifetime support.
Nikon sells these in a stack layer with no product recorded for ASML yet — nothing on the other side to compare them against.
Application
3D CT-reconstruction and scanning software for Nikon Metrology's industrial X-ray and CT systems, used for defect detection and dimensional inspection in electronics, additive-manufacturing, aerospace and automotive quality control. Its AI Reconstruction feature automates image enhancement to speed up scans and improve defect detection.
AI-powered software for Nikon's XT H-series X-ray CT systems that measures anode overhang in lithium-ion battery cells in 3D, faster and more precisely than manual slice inspection.
NIS.ai extends NIS-Elements with AI tools for image acquisition, visualization and analysis.