Discover AI Software
Machine-learning engine for semiconductor fabs that evaluates several models on in-process inputs and results, suggests the best one and recommends changes to process targets for yield optimization, virtual metrology and process prediction, licensed as a service.
Find alternatives to Discover AI Software
What it does
- Data analysis
- Industrial automation
Sources
- Pricing
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The page states no price, plan or free allowance; contact route only, so no pricing model is recorded.
- Description
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Official documentation · 21 Oct 2026
"Using machine learning, it examines interactions between in-process inputs and results for any semiconductor product family and recommends changes to in-process targets."
- What it does
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Official documentation · 21 Oct 2026
"Discover AI software leverages high-quality data input to provide valuable insights into processes and actionable predictions for process, yield and efficiency improvements".
- Sold within
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The page says the software works "through integration with the Discover data platform" but states no purchase relationship, plan or add-on entitlement, so no access term is written (read with curl 2026-10-21).
- Name
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Official documentation · 21 Oct 2026
Page title "Discover® AI Software - Onto Innovation"; the product is called Discover AI software throughout the page body.
- URL
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Official documentation · 21 Oct 2026
Onto's own product page, listed on its Process Control & Analytics Software category page as "Discover® AI Software" with the blurb "A cutting-edge AI engine built for semiconductor manufacturing" (https://ontoinnovation.com/product-categories/software/).
- Deployment
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Official documentation · 21 Oct 2026
"Licensed as a service, it enables users to leverage an on-demand infrastructure to apply easily understood workflows for complex analytics without the overhead."
- Modalities
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Official documentation · 21 Oct 2026
"By analyzing any set of conceivable inputs and outputs" of in-process data; the page describes tabular process inputs and results going in and recommended target changes coming out.
- Intended for
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Official documentation · 21 Oct 2026
"Easily understood visuals empower even casual users to understand what is important before making adjustments"; sold to semiconductor manufacturers (Featured Markets list on the page).
Also from Onto Innovation
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TrueADC Application
Defect-classification software that combines deep learning, a dynamic library of real defect examples and a multi-engine mode to classify wafer defects inline, flagging low-confidence defects as unknown and cutting manual review by over 70%.
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Yield Optimizer Software Application
Machine-learning software that relates in-process metrology readings to end-of-line test results, predicts yield and recommends changes to in-process metrology targets, with a design-of-experiment assistant, troubleshooting and neural-network models.
Open Onto Innovation in the directory
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