Yield Optimizer Software

Application

Machine-learning software that relates in-process metrology readings to end-of-line test results, predicts yield and recommends changes to in-process metrology targets, with a design-of-experiment assistant, troubleshooting and neural-network models.

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TypeApplication
RoleStandalone tool
AvailabilitySold
DeploymentSaaS
Intended forEnterprise
SecurityNot recorded
StatusActive
Sold withinPackaging not stated — the vendor’s page was checked and named no parent or plan
PricingNot recorded

What it does

ontoinnovation.com

Sources

Pricing

Not found · 21 Oct 2026

The page states no price, plan or free allowance; contact route only, so no pricing model is recorded.

Description

Official documentation · 21 Oct 2026

"Using machine learning, it examines the interactions between in-process metrology readings and end-of-line test results for any semiconductor product family and recommends changes to the in-process metrology targets."

What it does

Official documentation · 21 Oct 2026

"Yield Optimizer software evaluates multiple models and suggests the best one for the data."

Sold within

Not found · 21 Oct 2026

The page names no parent product and no purchase route beyond the contact form and "When licensed as a service"; no access term is written (read with curl 2026-10-21).

Name

Official documentation · 21 Oct 2026

Page heading and body call the product Yield Optimizer software; the category page lists it as "Yield Optimizer™ Software" (https://ontoinnovation.com/product-categories/software/).

URL

Official documentation · 21 Oct 2026

Onto's own product page, listed on its Process Control & Analytics Software category page as "Yield Optimizer™ Software" with the category-page blurb Machine learning built with semiconductor manufacturing in mind (https://ontoinnovation.com/product-categories/software/).

Deployment

Official documentation · 21 Oct 2026

"When licensed as a service, it enables users to leverage an on-demand infrastructure to apply easily understood workflows for complex analytics without the overhead."

Modalities

Official documentation · 21 Oct 2026

"By examining any set of conceivable inputs and outputs": in-process metrology readings and test results go in, recommended target changes come out.

Intended for

Official documentation · 21 Oct 2026

"Users across the fab benefit from Yield Optimizer software’s easy-to-apply analytics".

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